Hitachi High-Tech Launches the SU3900SE and SU3800SE Series High-Resolution Schottky Field Emission Scanning Electron Microscopes Allowing Observation of Large and Heavy Samples at the Nano Level

2024-05-28
Tokyo, May 28, 2024 – Hitachi High-Tech Corporation ("Hitachi High-Tech") announced today the launch of the SU3900SE and SU3800SE High-Resolution Schottky Scanning Electron Microscopes, which provide highly accurate and efficient observation of large and heavy specimens at the nano level.
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