Hitachi High-Tech Launches the AFM100 Pro High-Sensitivity Scanning Probe Microscope System with Improved Detection Sensitivity

Tokyo, June 28, 2022 – Hitachi High-Tech Corporation ("Hitachi High-Tech") today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM*1/SPM*2) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and enables measurement at atomic and molecular scales.